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Proceedings Paper

Infrared refractive indices and thermo-optic coefficients for several materials
Author(s): William J. Tropf; Michael E. Thomas; Milton J. Linevsky
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Paper Abstract

Two techniques for deriving refractive index from high- resolution interferometric infrared transmission measurements are presented. The general characteristics of these techniques are described. Artificial data are used to explore the sensitivity of these techniques to various error sources. Refractive index is determined from interferometric measurements of several materials, including diamond, cubic silicon carbide, yttrium oxide, and KRS-5. The described analysis techniques are applied in a complimentary way to develop temperature-dependent Sellmeier type refractive index models that give accurate dispersion and thermo-optic coefficients. For several of these materials our results are the first infrared measurements of temperature-dependent dispersion. Our results are compared to published refractive index and thermo-optic coefficient data when it exists.

Paper Details

Date Published: 8 October 1998
PDF: 12 pages
Proc. SPIE 3425, Optical Diagnostic Methods for Inorganic Transmissive Materials, (8 October 1998); doi: 10.1117/12.326661
Show Author Affiliations
William J. Tropf, Johns Hopkins Univ. (United States)
Michael E. Thomas, Johns Hopkins Univ. (United States)
Milton J. Linevsky, General Physics Corp. (United States)

Published in SPIE Proceedings Vol. 3425:
Optical Diagnostic Methods for Inorganic Transmissive Materials
Raju V. Datla; Leonard M. Hanssen, Editor(s)

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