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Proceedings Paper

Measurements of the nonlinear index of refraction using a polarization interferometer
Author(s): Artashes Yavrian; Tigran V. Galstian; Michel Piche
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Paper Abstract

We propose a single-beam interferometer where a doubly refracting crystal is used to create the two interferometer's arms. The scheme uses only one mirror for these two interferometer's arms. This allows to reduce significantly the influence of mechanical and thermal fluctuations. A simple imaging system is used to avoid complex theoretical interpretations.

Paper Details

Date Published: 9 October 1998
PDF: 4 pages
Proc. SPIE 3418, Advances in Optical Beam Characterization and Measurements, (9 October 1998); doi: 10.1117/12.326649
Show Author Affiliations
Artashes Yavrian, COPL/Univ. Laval (Canada)
Tigran V. Galstian, COPL/Univ. Laval (Canada)
Michel Piche, COPL/Univ. Laval (Canada)

Published in SPIE Proceedings Vol. 3418:
Advances in Optical Beam Characterization and Measurements
Michel Piche, Editor(s)

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