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Proceedings Paper

SPRT for Weibull distributed integrated circuit failures
Author(s): Rajarathnam Chandramouli; N. Vijaykrishnan; N. Ranganathan
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Paper Abstract

In this paper, we propose a sequential probability ratio test based on a two parameter Weibull distribution for IC failures. The shape parameter of the Weibull distribution characterizes the decreasing, constant and the increasing failure rate regions in the bath tub model for ICs. The algorithm detects the operating region of the IC based on the observed failure times. Unlike the fixed-length test, the proposed algorithm due to its sequential nature uses the minimum average number of devices for the test for fixed error tolerances in the detection procedure. We find that the proposed test is on an average 96 percent more efficient than the fixed-length test. Our algorithm is shown to be highly robust to the variations in the model parameters unlike other existing sequential tests. Further, extensive simulations are used to validate the analytic results of the sequential test.

Paper Details

Date Published: 28 August 1998
PDF: 12 pages
Proc. SPIE 3510, Microelectronic Manufacturing Yield, Reliability, and Failure Analysis IV, (28 August 1998); doi: 10.1117/12.324373
Show Author Affiliations
Rajarathnam Chandramouli, Univ. of South Florida (United States)
N. Vijaykrishnan, Univ. of South Florida (United States)
N. Ranganathan, Univ. of Texas at El Paso (United States)

Published in SPIE Proceedings Vol. 3510:
Microelectronic Manufacturing Yield, Reliability, and Failure Analysis IV
Sharad Prasad; Hans-Dieter Hartmann; Tohru Tsujide, Editor(s)

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