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Proceedings Paper

XD(xanthene dyes)-DC-PVA (dichromated polyvinyl alcohol) for holographic recording: measurement of the spatial resolution and applications
Author(s): Thierry Cornelissen; Christophe De Veuster; Jean J.A. Couture; Yvon L. M. Renotte; Yves F. Lion
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Paper Abstract

We report on the characterization of some photopolymer recording materials based on DC-PVA films sensitized or non- sensitized by some xanthene dyes. The limit of the spatial resolution was determined for different sample preparation techniques. It is well known that the quality of the recorded hologram depends on the spatial resolution of the recording material. A bad resolution will reduce the visibility of the reconstructed wave and damages the reconstructed image. It is therefore important to characterize the spatial resolution of the holographic recording material. In this work we compare the result obtained with two different techniques for preparing the DC- PVA plates. Interference patterns with different spatial frequencies are recorded in the material and the modulation transfer function of each pattern is measured in order to get the limit of the spatial resolution of each material. By the way each sample is characterized by the MTF curve versus spatial frequency and the end-user can choose the well- suited material for this particular application taking into account other parameters such as exposure time, intensity, etc. After the characterization of the materials we test their ability for some applications.

Paper Details

Date Published: 25 September 1998
PDF: 8 pages
Proc. SPIE 3417, Photopolymer Device Physics, Chemistry, and Applications IV, (25 September 1998); doi: 10.1117/12.323493
Show Author Affiliations
Thierry Cornelissen, Univ. de Liege (Belgium)
Christophe De Veuster, Univ. de Liege (Belgium)
Jean J.A. Couture, CEGEP de Beauce-Appalaches (Canada)
Yvon L. M. Renotte, Univ. de Liege (Belgium)
Yves F. Lion, Univ. de Liege (Belgium)

Published in SPIE Proceedings Vol. 3417:
Photopolymer Device Physics, Chemistry, and Applications IV
Roger A. Lessard, Editor(s)

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