Share Email Print

Proceedings Paper

Fringe pattern analysis methods: up-to-date review
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

The paper is intended to be a review of fringe pattern analysis, FPA methods and their capabilities to analyze extended class of fringe patterns. The special emphasis is paid to the distinction between passive and active methods and the general trend to hybridization of the approaches in FPA. More detailed description is given to the general description of the most commonly used FPA methods, namely: temporal and spatial carrier phase shifting methods. Latter various approaches to absolute phase determination basing an application of additional means or modification of system parameters and including fringe numbering, phase unwrapping or hierarchical unwrapping are analyzed and compassed.

Paper Details

Date Published: 29 September 1998
PDF: 11 pages
Proc. SPIE 3407, International Conference on Applied Optical Metrology, (29 September 1998); doi: 10.1117/12.323363
Show Author Affiliations
Malgorzata Kujawinska, Warsaw Univ. of Technology (Poland)
Wolfgang Osten, Bremen Institut fuer Angewandte Strahltechnik GmbH (Germany)

Published in SPIE Proceedings Vol. 3407:
International Conference on Applied Optical Metrology
Pramod Kumar Rastogi; Ferenc Gyimesi, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?