
Proceedings Paper
Long gauge block interferometer using two frequency-stabilized lasersFormat | Member Price | Non-Member Price |
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Paper Abstract
The design and construction of a laser interferometer using the method of exact fractions for high-accuracy calibration of gauge blocks up to about one meter in length, are described. The interferometer is based on the classical Michelson arrangement. A two-mode stabilized He-Ne laser emitting light at a wavelength of 633 nm is the primary wavelength reference for the interferometric length measurement, since its frequency is calibrated by heterodyne measurement with an iodine-stabilized He-Ne laser at 633 nm which is used to maintain the national meter standard. A second two-mode stabilized He-Ne laser, at a wavelength of 543 nm, is used in order define the absolute length. The estimated standard uncertainty for interferometric length measurements is about 50 nm for a 1 meter gauge block. Results from trial measurements made on various gauge blocks, including a bilateral comparison, are reported.
Paper Details
Date Published: 30 September 1998
PDF: 10 pages
Proc. SPIE 3477, Recent Developments in Optical Gauge Block Metrology, (30 September 1998); doi: 10.1117/12.323122
Published in SPIE Proceedings Vol. 3477:
Recent Developments in Optical Gauge Block Metrology
Jennifer E. Decker; Nicholas Brown, Editor(s)
PDF: 10 pages
Proc. SPIE 3477, Recent Developments in Optical Gauge Block Metrology, (30 September 1998); doi: 10.1117/12.323122
Show Author Affiliations
Mikael Frennberg, Swedish National Testing and Research Institute (Sweden)
M. Johansson, Swedish National Testing and Research Institute (Sweden)
Stefan Kaellberg, Swedish National Testing and Research Institute (Sweden)
M. Johansson, Swedish National Testing and Research Institute (Sweden)
Stefan Kaellberg, Swedish National Testing and Research Institute (Sweden)
U. Karn, Swedish National Testing and Research Institute (Sweden)
Leslie R. Pendrill, Swedish National Testing and Research Institute (Sweden)
Leslie R. Pendrill, Swedish National Testing and Research Institute (Sweden)
Published in SPIE Proceedings Vol. 3477:
Recent Developments in Optical Gauge Block Metrology
Jennifer E. Decker; Nicholas Brown, Editor(s)
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