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Proceedings Paper

Method of specifying high-quality optical systems
Author(s): Shai Eisenberg
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Paper Abstract

For optical systems which are nearly diffraction limited, the Strehl Ratio (SR) is a unique number, which relates the residual wavefront aberration to the diffraction image of a point source. A model is shown in which the optical parameters of an optical system can be specified quantitatively using the SR as a tool to assign a proper weight to each parameter of a merit function composed by the user. Such a method is particularly useful for specifying optics to be used in optical metrology systems where lateral deviations are critical to the precision of the instrument.

Paper Details

Date Published: 21 September 1998
PDF: 4 pages
Proc. SPIE 3482, International Optical Design Conference 1998, (21 September 1998); doi: 10.1117/12.321965
Show Author Affiliations
Shai Eisenberg, Omek Optics Ltd. (Israel)

Published in SPIE Proceedings Vol. 3482:
International Optical Design Conference 1998
Leo R. Gardner; Kevin P. Thompson, Editor(s)

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