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Proceedings Paper

Techniques for pixel-level analog-to-digital conversion
Author(s): Boyd A. Fowler; Abbas El Gamal; David X. D. Yang
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Paper Abstract

Two techniques for performing pixel level analog to digital conversion (ADC) are reviewed. The first is an over-sampling technique which uses a one bit first order (Sigma) (Delta) modulator for each 2 X 2 block of pixels to directly convert photocharge to bits. Each modulator is implemented using 17 transistors. The second technique is a Nyquist rate multi-channel-bit-serial (MCBS) ADC. The technique use successive comparisons to convert the pixel voltage to bits. Results obtained from implementations of these ADC techniques are presented. The techniques are compared based on size, charge handling capacity, FPN, noise sensitivity, data throughput, quantization, memory/processing, and power dissipation requirements for both visible an dIR imagers. From the comparison it appears that the (Sigma) (Delta) ADC is better suited to IR imagers, while the MCBS ADC is better suited to imagers in the visible range.

Paper Details

Date Published: 14 September 1998
PDF: 11 pages
Proc. SPIE 3360, Infrared Readout Electronics IV, (14 September 1998); doi: 10.1117/12.321753
Show Author Affiliations
Boyd A. Fowler, Stanford Univ. (United States)
Abbas El Gamal, Stanford Univ. (United States)
David X. D. Yang, Stanford Univ. (United States)

Published in SPIE Proceedings Vol. 3360:
Infrared Readout Electronics IV
Bedabrata Pain; Terrence S. Lomheim, Editor(s)

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