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Proceedings Paper

MTF measurement technique for GOES imager
Author(s): Jay Alan Overbeck; James J. Shea
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Paper Abstract

One of the sub-tasks for the GOES N/O program is to redesign the assembly/test program to reduce instrument test time and to make test results more comparable to data that can be taken on orbit and at the spacecraft integrator's facility. Currently, ITT A/CD measures the instrument MTF at specific spatial frequencies using a collimator and bar targets. This gives only a few individual points on the MTF curve. To improve this production test, the MTF will now be measured by scanning a single slit target. The result of this slit scan is the Line Spread Function (LSF) and the Fourier Transform of the LSF yields the continuous frequency MTF curve. Obtaining this curve with a single target eliminates the need for repeated scans using different spatial frequency targets. A problem with scanning a slit for this application is the number of samples taken across it is very few when the GOES scanner is running at operational speed. Two methods to collect multiple scan lines and recombining the scans to get a `highly sampled' scan of the slit have been considered. This paper discusses the two approaches and presents a validation of the slit scan method for both a slow scan of the target and for an operational speed scan where multiple scan lines are recombined to give a highly sampled slit.

Paper Details

Date Published: 26 August 1998
PDF: 10 pages
Proc. SPIE 3377, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing IX, (26 August 1998); doi: 10.1117/12.319370
Show Author Affiliations
Jay Alan Overbeck, ITT Corp. (United States)
James J. Shea, Swales & Associates, Inc. (United States)

Published in SPIE Proceedings Vol. 3377:
Infrared Imaging Systems: Design, Analysis, Modeling, and Testing IX
Gerald C. Holst, Editor(s)

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