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Proceedings Paper

Testing method for CDs
Author(s): Yi Zhang; Yuchang Lu; Duanyi Xu; Longfa Pan
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Paper Abstract

This paper provides a method to test some parameters of CDs. These parameters show the quality of the disks directly. The method is based on a commercial CD-ROM and a common computer. Some necessary circuits and software are added in. The analytic results can be provided.

Paper Details

Date Published: 10 August 1998
PDF: 5 pages
Proc. SPIE 3562, Optical Storage Technology, (10 August 1998); doi: 10.1117/12.318487
Show Author Affiliations
Yi Zhang, Tsinghua Univ. (China)
Yuchang Lu, Tsinghua Univ. (China)
Duanyi Xu, Tsinghua Univ. (China)
Longfa Pan, Tsinghua Univ. (China)

Published in SPIE Proceedings Vol. 3562:
Optical Storage Technology
Duanyi Xu; Seiya Ogawa, Editor(s)

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