Proceedings Paper
Determination of figure of merit (FOM) of Ti-doped sapphire laser crystal material| Format | Member Price | Non-Member Price |
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Paper Abstract
A new method for measuring the figure of merit of Ti-dopes sapphire crystals is proposed in this paper. Its operating principle and measuring method are presented. The measuring accuracy has been greatly improved by means of the double- light path structures and the light incoming the crystal surface with Brewster angle. The measuring system has the advantages of simple construction and easy operation. The transmissivity measuring accuracy for Ti-doped sapphire crystal with length of 20 approximately 30 mm is about +/- 0.005. The measuring range for figure of merit is 100 approximately 150 and the measuring results have a good repeatability.
Paper Details
Date Published: 5 August 1998
PDF: 5 pages
Proc. SPIE 3557, Current Developments in Optical Elements and Manufacturing, (5 August 1998); doi: 10.1117/12.318329
Published in SPIE Proceedings Vol. 3557:
Current Developments in Optical Elements and Manufacturing
Qiming Xin; Robert E. Parks, Editor(s)
PDF: 5 pages
Proc. SPIE 3557, Current Developments in Optical Elements and Manufacturing, (5 August 1998); doi: 10.1117/12.318329
Show Author Affiliations
Lin Su, Beijing Institute of Technology (China)
Ping Yan, Beijing Institute of Technology (China)
Boyu Ding, Beijing Institute of Technology (China)
Ping Yan, Beijing Institute of Technology (China)
Boyu Ding, Beijing Institute of Technology (China)
Guowei Zhang, Beijing Institute of Technology (United States)
Yang Yang, Beijing Institute of Technology (China)
Yang Yang, Beijing Institute of Technology (China)
Published in SPIE Proceedings Vol. 3557:
Current Developments in Optical Elements and Manufacturing
Qiming Xin; Robert E. Parks, Editor(s)
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