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Proceedings Paper

Multimode interference and a white light scanning Michelson interferometer with a 400-mm sapphire fiber sensing head
Author(s): Tianchu Li; Russell G. May; Anbo Wang; Richard O. Claus
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Paper Abstract

In this paper we present the analysis of multimode (MM) interference induced by MM fiber interferometers and report the development of a white light scanning fiber Michelson interferometer with a sapphire fiber sensing head for the measurement of position-distance at high temperatures. The 'mode fading' effect in standard graded 50/125 micrometers fiber and independent 'inter-mode interference' in 100 micrometers step index profile fiber are discussed. By means of the 'mode selecting' technique, proposed and developed in this work, we demonstrated white light fringes with signal to noise ratios of more than 12 with a sensing head composed of a 400 mm long lead sapphire fiber and an uncoated sapphire target fiber.

Paper Details

Date Published: 13 August 1998
PDF: 8 pages
Proc. SPIE 3555, Optical and Fiber Optic Sensor Systems, (13 August 1998); doi: 10.1117/12.318159
Show Author Affiliations
Tianchu Li, China Institute of Metrology (China)
Russell G. May, Virginia Polytechnic Institute and State Univ. (United States)
Anbo Wang, Virginia Polytechnic Institute and State Univ. (United States)
Richard O. Claus, Virginia Polytechnic Institute and State Univ. (United States)

Published in SPIE Proceedings Vol. 3555:
Optical and Fiber Optic Sensor Systems
Shanglian Huang; Kim D. Bennett; David A. Jackson, Editor(s)

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