Proceedings Paper
Determination of dispersions of electro-optic coefficients and charge carrier densities of photorefractive crystals| Format | Member Price | Non-Member Price |
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Paper Abstract
We propose and demonstrate simple methods to determine accurately the dispersion of electro-optic coefficients and effective charge carrier densities of photorefractive crystals. A Ce-doped BaTiO3:Ce crystal was determined. Then by measuring the two-beam coupling coefficient at different wavelengths and crossing angles, we can determine accurately the variation with wavelength of effective charge carrier density of the crystal.
Paper Details
Date Published: 17 August 1998
PDF: 5 pages
Proc. SPIE 3554, Photorefractive Materials: Phenomena and Related Applications II, (17 August 1998); doi: 10.1117/12.318112
Published in SPIE Proceedings Vol. 3554:
Photorefractive Materials: Phenomena and Related Applications II
Peixian Ye; Tsutomu Shimura; Ratnakar R. Neurgaonkar, Editor(s)
PDF: 5 pages
Proc. SPIE 3554, Photorefractive Materials: Phenomena and Related Applications II, (17 August 1998); doi: 10.1117/12.318112
Show Author Affiliations
Shuoxing Dou, Institute of Physics and Ctr. for Condensed Matter Physics (China)
Juntae Kim, Kangwon National Univ. (China)
Jaichul Yi, Kangwon National Univ. (China)
Seungwoo Yi, Kangwon National Univ. (China)
Juntae Kim, Kangwon National Univ. (China)
Jaichul Yi, Kangwon National Univ. (China)
Seungwoo Yi, Kangwon National Univ. (China)
Sungdo Cha, Kangwon National Univ. (United States)
Seung-Ho Mr. Shin, Kangwon National Univ. (China)
Yong Zhu, Institute of Physics and Ctr. for Condensed Matter Physics (China)
Peixian Ye, Institute of Physics and Ctr. for Condensed Matter Physics (China)
Seung-Ho Mr. Shin, Kangwon National Univ. (China)
Yong Zhu, Institute of Physics and Ctr. for Condensed Matter Physics (China)
Peixian Ye, Institute of Physics and Ctr. for Condensed Matter Physics (China)
Published in SPIE Proceedings Vol. 3554:
Photorefractive Materials: Phenomena and Related Applications II
Peixian Ye; Tsutomu Shimura; Ratnakar R. Neurgaonkar, Editor(s)
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