
Proceedings Paper
Effect of external applied alternative electric field on the temporal variation of photorefractive fundamental harmonic of space-charge fieldFormat | Member Price | Non-Member Price |
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Paper Abstract
In this paper, we took the hopping model to discuss the temporal variation of the fundamental harmonic of the space- charge field with external Sinusoidal field and square wave electric field, respectively. We presented the approximate analytical expression of the fundamental harmonic of the space-charge field versus time and the applied field amplitude. We also study the temporal variation of the real and the imaginary of the fundamental harmonic of the normalized space-charge field with different applied AC electric field, respectively. It is found that the real part of the fundamental space-charge field varies at the same frequency as the applied AC field, the imaginary part oscillates at twice the frequency. These results are in agreement with those derived from the band-transport model.
Paper Details
Date Published: 17 August 1998
PDF: 6 pages
Proc. SPIE 3554, Photorefractive Materials: Phenomena and Related Applications II, (17 August 1998); doi: 10.1117/12.318109
Published in SPIE Proceedings Vol. 3554:
Photorefractive Materials: Phenomena and Related Applications II
Peixian Ye; Tsutomu Shimura; Ratnakar R. Neurgaonkar, Editor(s)
PDF: 6 pages
Proc. SPIE 3554, Photorefractive Materials: Phenomena and Related Applications II, (17 August 1998); doi: 10.1117/12.318109
Show Author Affiliations
Yuwen Feng, Harbin Institute of Technology (China)
Xiudong Sun, Harbin Institute of Technology (China)
Zhongxiang Zhou, Harbin Institute of Technology (China)
Xiudong Sun, Harbin Institute of Technology (China)
Zhongxiang Zhou, Harbin Institute of Technology (China)
Yongyuan Jiang, Harbin Institute of Technology (China)
Yan Li, Harbin Institute of Technology (China)
Yan Li, Harbin Institute of Technology (China)
Published in SPIE Proceedings Vol. 3554:
Photorefractive Materials: Phenomena and Related Applications II
Peixian Ye; Tsutomu Shimura; Ratnakar R. Neurgaonkar, Editor(s)
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