
Proceedings Paper
Thermal image measurement and analysis under obscured IR smoke screen conditionsFormat | Member Price | Non-Member Price |
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Paper Abstract
Under the condition of laying artificial smoke screen, studying transmission property of IR, laser and visible light, especially studying the effect of smoke screen on transmission of thermal image of target is of theoretical and practical significance. The paper is based on a field- testing during which artificial IR smoke screen was produced. In the course of testing, typical motor vehicle in operating condition was chosen as target. By combing the change of typical thermal image which was taken by AGEMA-880 thermovision before and after IR smoke screen producing with a large amount of data concerned, the nature and law are studied and analyzed that different types of IR smoke screen have an effect on thermal image of target and image quality of thermovision. Therefore, we further have put forward that the change of thermal image quality is reflected under the influence of smoke screen by fractal fitting error.
Paper Details
Date Published: 11 August 1998
PDF: 4 pages
Proc. SPIE 3553, Detectors, Focal Plane Arrays, and Imaging Devices II, (11 August 1998); doi: 10.1117/12.318083
Published in SPIE Proceedings Vol. 3553:
Detectors, Focal Plane Arrays, and Imaging Devices II
Pingzhi Liang; Marc Wigdor; William G. D. Frederick, Editor(s)
PDF: 4 pages
Proc. SPIE 3553, Detectors, Focal Plane Arrays, and Imaging Devices II, (11 August 1998); doi: 10.1117/12.318083
Show Author Affiliations
Zeying Chi, Nanjing Univ. of Science and Technology (China)
Zhigang Chen, Nanjing Univ. of Science and Technology (China)
Wenjian Chen, Nanjing Univ. of Science and Technology (China)
Zhigang Chen, Nanjing Univ. of Science and Technology (China)
Wenjian Chen, Nanjing Univ. of Science and Technology (China)
Li Li, Nanjing Univ. of Science and Technology (China)
Mingjun You, Nanjing Univ. of Science and Technology (China)
Mingjun You, Nanjing Univ. of Science and Technology (China)
Published in SPIE Proceedings Vol. 3553:
Detectors, Focal Plane Arrays, and Imaging Devices II
Pingzhi Liang; Marc Wigdor; William G. D. Frederick, Editor(s)
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