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Proceedings Paper

Design for a near-infrared immersion echelle spectrograph: breaking the R=100,000 barrier from 1.5 to 5 um
Author(s): Luke D. Keller; Daniel T. Jaffe; Greg W. Doppmann
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Paper Abstract

We have designed a near IR spectrograph, sensitive in the 1.5-5 micrometers range, that uses a silicon immersion echelle grating. The cross-dispersed design demonstrates that immersion echelles allow compact spectrographs which have excellent spectral coverage and very high resolving power. Our instrument will have continuous spectral coverage over a 5.7 percent passband at 2.3 micrometers or a 7.6 percent passband at 4.6 micrometers and resolving power ranging from R equals 87,000 at 4.6 micrometers to 109,000 at 2.3 micrometers . We discuss design issues that are unique to spectrographs using silicon immersion echelle gratings in the near IR such as grating parameters, geometry, and the mechanical and thermal properties of large pieces of single crystal silicon.

Paper Details

Date Published: 21 August 1998
PDF: 10 pages
Proc. SPIE 3354, Infrared Astronomical Instrumentation, (21 August 1998); doi: 10.1117/12.317312
Show Author Affiliations
Luke D. Keller, Univ. of Texas/Austin (United States)
Daniel T. Jaffe, Univ. of Texas/Austin (United States)
Greg W. Doppmann, Univ. of Texas/Austin (United States)

Published in SPIE Proceedings Vol. 3354:
Infrared Astronomical Instrumentation
Albert M. Fowler, Editor(s)

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