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Proceedings Paper

Deep Space 3 metrology system
Author(s): Serge Dubovitsky; Roger P. Linfield; Gary H. Blackwood; Peter W. Gorham; Michael Shao; William M. Folkner; Jeffrey W. Yu
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Paper Abstract

A metrology subsystem on board the Deep Space 3, a separated spacecraft interferometer mission, is used to determine stellar fringe delay jitter, delay rate, and initial delay. The subsystem implements two capabilities: linear metrology for optical pathlength determination and angular metrology needed to determine the configuration and orientation of the spacecraft constellation. Frequency modulated metrology concept is used to implement high-precision (5nm) interferometric linear measurements over large target ranges (1km). System is made angle sensitive by using an articulated flat mirror at the target.

Paper Details

Date Published: 24 July 1998
PDF: 10 pages
Proc. SPIE 3350, Astronomical Interferometry, (24 July 1998); doi: 10.1117/12.317103
Show Author Affiliations
Serge Dubovitsky, Jet Propulsion Lab. (United States)
Roger P. Linfield, Jet Propulsion Lab. (United States)
Gary H. Blackwood, Jet Propulsion Lab. (United States)
Peter W. Gorham, Jet Propulsion Lab. (United States)
Michael Shao, Jet Propulsion Lab. (United States)
William M. Folkner, Jet Propulsion Lab. (United States)
Jeffrey W. Yu, Jet Propulsion Lab. (United States)

Published in SPIE Proceedings Vol. 3350:
Astronomical Interferometry
Robert D. Reasenberg, Editor(s)

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