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Proceedings Paper

Diffraction spectrometer for spectral analysis of mammographic x-ray sources
Author(s): Tong Yu; John M. Boone
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Paper Abstract

The use of a diffraction spectrometer developed by Deslattes for determination of mammographic kV is extended to the measurement of accurate, relative x-ray spectra. A series of x-ray spectra were acquired by passing an x-ray beam through a bent-silicon diffraction crystal, and the diffracted x-rays were detected by a charge coupled device (CCD) coupled to an x-ray scintillating screen. The raw spectra were corrected both on the energy axis and on the x-ray photon fluence axis. The measured, corrected x-ray spectra were compared against tabulated x-ray spectra measured under similar conditions. Results indicate that the current device is capable of producing accurate relative x-ray spectra in the mammography energy range.

Paper Details

Date Published: 24 July 1998
PDF: 7 pages
Proc. SPIE 3336, Medical Imaging 1998: Physics of Medical Imaging, (24 July 1998); doi: 10.1117/12.317059
Show Author Affiliations
Tong Yu, Univ. of California/Davis Medical Ctr. (United States)
John M. Boone, Univ. of California/Davis Medical Ctr. (United States)

Published in SPIE Proceedings Vol. 3336:
Medical Imaging 1998: Physics of Medical Imaging
James T. Dobbins III; John M. Boone, Editor(s)

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