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Proceedings Paper

DQE and system optimization for indirect-detection flat-panel imagers in diagnostic radiology
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Paper Abstract

The performance of indirect-detection flat-panel imagers incorporating CsI:Tl x-ray converters is examined through calculation of the detective quantum efficiency (DQE) under conditions of chest radiography, fluoroscopy, and mammography. Calculations are based upon a cascaded systems model which has demonstrated excellent agreement with empirical signal, noise- power spectra, and DQE results. For each application, the DQE is calculated as a function of spatial-frequency and CsI:Tl thickness. A preliminary investigation into the optimization of flat-panel imaging systems is described, wherein the x-ray converter thickness which provides optimal DQE for a given imaging task is estimated. For each application, a number of example tasks involving detection of an object of variable size and contrast against a noisy background are considered. The method described is fairly general and can be extended to account for a variety of imaging tasks. For the specific examples considered, the preliminary results estimate optimal CsI:Tl thicknesses of approximately 450 micrometer (approximately 200 mg/cm2), approximately 320 micrometer (approximately 140 mg/cm2), and approximately 200 micrometer (approximately 90 mg/cm2) for chest radiography, fluoroscopy, and mammography, respectively. These results are expected to depend upon the imaging task as well as upon the quality of available CsI:Tl, and future improvements in scintillator fabrication could result in increased optimal thickness and DQE.

Paper Details

Date Published: 24 July 1998
PDF: 10 pages
Proc. SPIE 3336, Medical Imaging 1998: Physics of Medical Imaging, (24 July 1998); doi: 10.1117/12.317057
Show Author Affiliations
Jeffrey H. Siewerdsen, Univ. of Michigan Medical Ctr. (Canada)
Larry E. Antonuk, Univ. of Michigan Medical Ctr. (United States)

Published in SPIE Proceedings Vol. 3336:
Medical Imaging 1998: Physics of Medical Imaging
James T. Dobbins III; John M. Boone, Editor(s)

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