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Proceedings Paper

Radiometric, noise, and spatial characterization of the wideband infrared scene projector
Author(s): Steven Arthur Marlow; David S. Flynn; James R. Kircher
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Paper Abstract

The Wideband Infrared Scene Projector (WISP) has been undergoing development for the AF Research Laboratory Kinetic Kill Vehicle Hardware-in-the-loop Simulator facility (KHILS) at Eglin AFB, FL. Numerous characterization measurements defining array dynamic range, spectral output, temporal response and nonuniformity have been performed and reported on in the past. This paper addresses the measurements and analyses performed to characterize the radiometric, spatial, and temporal noise errors induced by the array on a unit under test (UUT). An Amber camera was used as the UUT. The Amber camera spectral, spatial and radiometric response characteristics were measured. The camera spatial and temporal noises were measured by observing an extended blackbody. Similar measurements were then made on the WISP/UUT system by projecting uniform scenes. The WISP spatial and radiometric responses and the WISP-induced spatial and temporal noise were determined from the measurements. Although the measurements are unique to the UUT adopted, the WISP contribution to the system noise-equivalent temperature difference (NEDT) was determined. The spatial noise measurements provided data for validating a spatial noise model described in a companion paper. The measurements and models are useful for analyzing future measurements and predicting the impact of WISP on various test articles.

Paper Details

Date Published: 13 July 1998
PDF: 9 pages
Proc. SPIE 3368, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing III, (13 July 1998); doi: 10.1117/12.316363
Show Author Affiliations
Steven Arthur Marlow, Seeker Technologies Inc. (United States)
David S. Flynn, Seeker Technologies Inc. (United States)
James R. Kircher, Science Applications International Corp. (United States)

Published in SPIE Proceedings Vol. 3368:
Technologies for Synthetic Environments: Hardware-in-the-Loop Testing III
Robert Lee Murrer Jr., Editor(s)

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