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Proceedings Paper

Active optical metrology: a definition with examples
Author(s): Wolfgang Osten
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Paper Abstract

This paper deals with the discussion of several problems in optical metrology which can be solved better by an active approach - the so-called active optical metrology. As an important difference in comparison to classical passive procedures the role of the model of the image formation/measuring process and its implementation into an active controlled feedback loop is analyzed. On example of phase reconstruction from 2D fringe patterns the necessity and the advantages of the active approach are explained first. Finally three examples are given where the solutions of complex measuring problems in HNDT and shape measurement are found by the implementation of active controlled feedback loops.

Paper Details

Date Published: 30 June 1998
PDF: 15 pages
Proc. SPIE 3478, Laser Interferometry IX: Techniques and Analysis, (30 June 1998); doi: 10.1117/12.312938
Show Author Affiliations
Wolfgang Osten, Bremen Institute of Applied Beam Technology (Germany)

Published in SPIE Proceedings Vol. 3478:
Laser Interferometry IX: Techniques and Analysis
Malgorzata Kujawinska; Gordon M. Brown; Mitsuo Takeda, Editor(s)

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