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Proceedings Paper

Entropy-based optimal sensor location for structural damage detection
Author(s): James L. Beck; Costas Papadimitriou; Siu-Kui Au; Michael W. Vanik
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Paper Abstract

A statistical methodology is presented for optimally locating the sensors in a structure for the purpose of extracting from the measured data the most information about the parameters of the model used to represent structural behavior. The methodology can be used in model updating and in damage detection and localization. It properly handles the unavoidable uncertainties in the measured data as well as the model uncertainties. The optimality criterion for the senor locations is based on information entropy which is a unique measure of the uncertainty in the model parameters. The uncertainty in these parameters is computed by the Bayesian statistical methodology and then the entropy measure is minimized over the set of possible sensor configurations using a genetic algorithm. The information entropy measure is also extended to handel large uncertainties expected in the pre- test nominal model of a structure. In experimental design, the proposed entropy-based methodology provides a rational procedure for comparing and evaluating the benefits of adding more sensors in the structure against the benefits of exciting and observing (measuring) more modes using the existing number of sensors. Simplified models for building and bridge structures are used to illustrate the methodology.

Paper Details

Date Published: 17 June 1998
PDF: 12 pages
Proc. SPIE 3325, Smart Structures and Materials 1998: Smart Systems for Bridges, Structures, and Highways, (17 June 1998);
Show Author Affiliations
James L. Beck, California Institute of Technology (United States)
Costas Papadimitriou, California Institute of Technology (United States)
Siu-Kui Au, California Institute of Technology (United States)
Michael W. Vanik, The Aerospace Corp. (United States)

Published in SPIE Proceedings Vol. 3325:
Smart Structures and Materials 1998: Smart Systems for Bridges, Structures, and Highways
S.-C. Liu, Editor(s)

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