Share Email Print

Proceedings Paper

Dynamic characterization of step-induced vibrations of x-ray mask membranes
Author(s): Michael P. Schlax; Roxann L. Engelstad; Edward G. Lovell
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

Structural damping experiments on x-ray mask membranes have been conducted at the University of Wisconsin and are reported in this paper. For the experiments, the mask format complied with the ARPA-NIST National X-ray Mask Standard. Effective damping parameters have been measured for a 29 mm X 29 mm X 2 micrometers silicon nitride membrane over a pressure range from 1 mtorr to atmospheric. Viscous effects, squeeze film compressibility and added mass effects have al been assessed. Experiments have also been performed on 20 mm and 13 mm square silicon nitride membranes in order to examine the effect of surface area on structural damping. Results from these experiments will provide valuable data on the damping characteristics of mask membranes, ultimately needed in the dynamic transient modeling of mask structural components.

Paper Details

Date Published: 5 June 1998
PDF: 9 pages
Proc. SPIE 3331, Emerging Lithographic Technologies II, (5 June 1998); doi: 10.1117/12.309626
Show Author Affiliations
Michael P. Schlax, Univ. of Wisconsin/Madison (United States)
Roxann L. Engelstad, Univ. of Wisconsin/Madison (United States)
Edward G. Lovell, Univ. of Wisconsin/Madison (United States)

Published in SPIE Proceedings Vol. 3331:
Emerging Lithographic Technologies II
Yuli Vladimirsky, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?