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Proceedings Paper

Applications of high-resolution ICP-AES in the nuclear industry
Author(s): Stephen G. Johnson; J. J. Giglio; Phillip S. Goodall; D. G. Cummings
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Paper Abstract

Application of high resolution ICP-AES to selected problems of importance in the nuclear industry is a growing field. The advantages in sample preparation time, waste minimization and equipment cost are considerable. Two examples of these advantages are presented in this paper, burnup analysis of spent fuel and analysis of major uranium isotopes. The determination of burnup, an indicator of fuel cycle efficiency, has been accomplished by the determination of 139La by high resolution inductively coupled plasma atomic emission spectroscopy (HR-ICP-AES). Solutions of digested samples of reactor fuel rods were introduced into a shielded glovebox housing an inductively coupled plasma and the resulting atomic emission transmitted to a high resolution spectrometer by a 31 meter fiber optic bundle. Total and isotopic U determination by thermal ionization mass spectrometry is presented to allow for the calculation of burnup for the samples. This method of burnup determination reduces the time, material, sample handling and waste generated associated with typical burnup determinations which require separation of lanthanum from the other fission products with high specific activities. Work concerning an alternative burnup indicator, 236U, is also presented for comparison. The determination of 235U:$_238)U isotope ratios in U-Zr fuel alloys is also presented to demonstrate the versatility of Hr-ICP-AES.

Paper Details

Date Published: 15 May 1998
PDF: 10 pages
Proc. SPIE 3270, Methods for Ultrasensitive Detection, (15 May 1998);
Show Author Affiliations
Stephen G. Johnson, Argonne National Lab. (United States)
J. J. Giglio, Argonne National Lab. (United States)
Phillip S. Goodall, Argonne National Lab. (United States)
D. G. Cummings, Argonne National Lab. (United States)

Published in SPIE Proceedings Vol. 3270:
Methods for Ultrasensitive Detection
Bryan L. Fearey, Editor(s)

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