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Proceedings Paper

Monolithic wavelength-graded VCSEL and wavelength-selective photodetector arrays for wavelength-division-multiplexed optical interconnect applications
Author(s): Julian Cheng; Sanh Q. Luong; Yuxin Zhou; Andrew C. Alduino; Jun Lu; Christopher P. Hains; N. Y. Li; Hong Q. Hou; G. Allen Vawter
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Paper Abstract

Monolithic, uniformly-wavelength-graded, vertical-cavity surface- emitting laser (VCSEL) and wavelength-selective resonance- enhanced photodetector (REPD) arrays are key enabling technologies for many wavelength-multiplexed optical network and interconnect architectures. These arrays can be produced in a repeatable and uniform manner by controlling the local MOCVD growth rate of the epilayers on a topographically patterned substrate, which resulted in wavelength-differentiated devices with more uniform optical characteristics. Multi-wavelength VCSEL and REPD arrays have been monolithically integrated on the same substrate to improve the wavelength matching between the source and detector elements. The performance characteristics of these arrays are discussed. We also describe a wavelength-division- multiplexing and demultiplexing experiment in which several channels of optical data are multiplexed together using a multi- wavelength VCSEL array and transmitted on a single optical fiber, and are demultiplexed at the other end using a wavelength- selective REPD array with closely-matching wavelengths.

Paper Details

Date Published: 5 May 1998
PDF: 8 pages
Proc. SPIE 3288, Optoelectronic Interconnects V, (5 May 1998); doi: 10.1117/12.307561
Show Author Affiliations
Julian Cheng, Univ. of New Mexico (United States)
Sanh Q. Luong, Univ. of New Mexico (United States)
Yuxin Zhou, Univ. of New Mexico (United States)
Andrew C. Alduino, Univ. of New Mexico (United States)
Jun Lu, Univ. of New Mexico (United States)
Christopher P. Hains, Univ. of New Mexico (United States)
N. Y. Li, Univ. of New Mexico (United States)
Hong Q. Hou, Sandia National Labs. (United States)
G. Allen Vawter, Sandia National Labs. (United States)

Published in SPIE Proceedings Vol. 3288:
Optoelectronic Interconnects V
Ray T. Chen; Julian P. G. Bristow, Editor(s)

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