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Proceedings Paper

New directions in surface spectroscopy enabled by ultrafast lasers
Author(s): P. T. Wilson; Yun-Shik Lee; Y. Jiang; D. Lim; R. Kempf; R. Bungener; X. F. Hu; Jerry I. Dadap Jr.; Mark H. Anderson; M. ter Beek; Z. Xu; N. M. Russell; John G. Ekerdt; P. S. Parkinson; E. D. Mishina; Oleg A. Aktsipetrov; Michael C. Downer
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Paper Abstract

Solid state femtosecond lasers enable powerful new nonlinear optical spectroscopic characterization techniques for technologically relevant Column IV and III-V semiconductor interfaces and growth surfaces.

Paper Details

Date Published: 30 April 1998
PDF: 6 pages
Proc. SPIE 3272, Laser Techniques for Surface Science III, (30 April 1998); doi: 10.1117/12.307114
Show Author Affiliations
P. T. Wilson, Univ. of Texas at Austin (United States)
Yun-Shik Lee, Univ. of Texas at Austin (United States)
Y. Jiang, Univ. of Texas at Austin (United States)
D. Lim, Univ. of Texas at Austin (United States)
R. Kempf, Univ. of Texas at Austin (United States)
R. Bungener, Univ. of Texas at Austin (United States)
X. F. Hu, Univ. of Texas at Austin (United States)
Jerry I. Dadap Jr., Univ. of Texas at Austin (United States)
Mark H. Anderson, Univ. of Texas at Austin (United States)
M. ter Beek, Univ. of Texas at Austin (United States)
Z. Xu, Univ. of Texas at Austin (United States)
N. M. Russell, Univ. of Texas at Austin (United States)
John G. Ekerdt, Univ. of Texas at Austin (United States)
P. S. Parkinson, Univ. of Texas at Austin (United States)
E. D. Mishina, Moscow State Univ. (Russia)
Oleg A. Aktsipetrov, Moscow State Univ. (Russia)
Michael C. Downer, Univ. of Texas at Austin (United States)


Published in SPIE Proceedings Vol. 3272:
Laser Techniques for Surface Science III
Hai-Lung Dai; Hans-Joachim Freund, Editor(s)

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