Share Email Print

Proceedings Paper

Quantitative damage morphology analysis of laser-induced surface cracks in fused silica at 355 nm
Author(s): Francois Y. Genin; Jack H. Campbell; J. M. Yoshiyama; Alberto Salleo; Timothy Sands
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

A morphology study was conducted on fused silica surfaces damaged by single pulse laser irradiation at 355 nm. The physical characterization of the surface showed that cracks initiate at ellipsoidal pits on both input and output surfaces. The size of the pit increases with laser pulse-length and the orientation of the ellipse is perpendicular to the electric field. The pits are less than 300 nm deep. Cracks initiate along the main axis of the ellipse. The morphology of the cracks is different for input vs. output surfaces. The output surface crack exhibits a shell- like morphology typical of localized compressive stress. The input surface crack shows, on the other hand, a star-like pattern. These differences seem to be caused by differences in plasma propagation on the surface. The extent of damage and the number of shells or branches increases with increasing fluence. A molten morphology can be observed at the center of the cracks for fluences above the pit formation threshold. This indicates that local temperatures can be in excess of several thousand degrees C.

Paper Details

Date Published: 20 April 1998
PDF: 2 pages
Proc. SPIE 3244, Laser-Induced Damage in Optical Materials: 1997, (20 April 1998); doi: 10.1117/12.307036
Show Author Affiliations
Francois Y. Genin, Lawrence Livermore National Lab. (United States)
Jack H. Campbell, Lawrence Livermore National Lab. (United States)
J. M. Yoshiyama, Lawrence Livermore National Lab. (United States)
Alberto Salleo, Univ. of California/Berkeley (United States)
Timothy Sands, Univ. of California/Berkeley (United States)

Published in SPIE Proceedings Vol. 3244:
Laser-Induced Damage in Optical Materials: 1997
Gregory J. Exarhos; Arthur H. Guenther; Mark R. Kozlowski; M. J. Soileau, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?