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Proceedings Paper

Test of experimental setup for reflectance measurement at wavelengths 1.06 and 10.6 m
Author(s): Udo Koschade; Bernhard Steiger
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Paper Abstract

A set-up for the reflectance measurement of materials or optical system at 1.06 and 10.6 micrometers wavelengths is presented. It is based on the reflection measuring method of the Institut fuer Strahlwerkzeuge in Stuttgart, Germany. In contrast to it, we used an acousto- optical modulator instead of a mechanical chopper mirror. Advantages are the higher maximum chopper frequency of 100 kHz and the absence of mechanically moved parts. In consequence, the signal to noise ratio is improved. Some problems arise form the diffraction efficiency of the modulator and form the generation of higher order diffraction. In this script first results are presented on the calibration of the measuring set-up, the measuring procedure and the calculation of the actual reflectance from the measured data.

Paper Details

Date Published: 20 April 1998
PDF: 4 pages
Proc. SPIE 3244, Laser-Induced Damage in Optical Materials: 1997, (20 April 1998); doi: 10.1117/12.306984
Show Author Affiliations
Udo Koschade, Univ. of Technology and Economics (FH) Mittweida (Germany)
Bernhard Steiger, Univ. of Technology and Economics (FH) Mittweida (Germany)

Published in SPIE Proceedings Vol. 3244:
Laser-Induced Damage in Optical Materials: 1997
Gregory J. Exarhos; Arthur H. Guenther; Mark R. Kozlowski; M. J. Soileau, Editor(s)

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