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Proceedings Paper

Fullerene-embedded Langmuir-Blodgett films probed by spectroscopic ellipsometry
Author(s): Eugene G. Bortchagovsky; Igor A. Yurchenko; Zoya I. Kazantseva; Josef Humlicek; Jaroslav Hora
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Paper Abstract

This work presents the first results of ellipsometric investigation of fullerene embedded Langmuir-Blodgett films on gold with surface plasmon excitation. In contrast to the standard ellipsometry, the spectrum of the delta angle obtained in such way has pronounced peculiarities at the C60 optical transitions. Obtained data unambiguous exhibit dependence of electromagnetic response of the system of interest on the proximity of fullerene to the gold surface.

Paper Details

Date Published: 20 April 1998
PDF: 7 pages
Proc. SPIE 3359, Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics 1997, (20 April 1998); doi: 10.1117/12.306243
Show Author Affiliations
Eugene G. Bortchagovsky, Institute of Semiconductor Physics (Ukraine)
Igor A. Yurchenko, Institute of Semiconductor Physics (Ukraine)
Zoya I. Kazantseva, Institute of Semiconductor Physics (Ukraine)
Josef Humlicek, Masaryk Univ. (Czech Republic)
Jaroslav Hora, Masaryk Univ. (Czech Republic)


Published in SPIE Proceedings Vol. 3359:
Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics 1997
Sergey V. Svechnikov; Mikhail Ya. Valakh, Editor(s)

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