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Proceedings Paper

Direct measurements of transient structures by means of time-resolved x-ray diffraction
Author(s): Peilin Chen; Ivan V. Tomov; Peter M. Rentzepis
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Paper Abstract

Nanosecond x-ray pulses have been used for time resolved x- ray diffraction to measure the transient structure of Pt and GaAs crystals caused by laser pulse heating. A direct imaging x-ray CCD system with high spatial resolution allows the detection for the lattice deformations of the order of 10-4 A, induced by a laser pulse energy of a few millijoules.

Paper Details

Date Published: 24 April 1998
PDF: 9 pages
Proc. SPIE 3273, Laser Techniques for Condensed-Phase and Biological Systems, (24 April 1998); doi: 10.1117/12.306132
Show Author Affiliations
Peilin Chen, Univ. of California/Irvine (United States)
Ivan V. Tomov, Univ. of California/Irvine (United States)
Peter M. Rentzepis, Univ. of California/Irvine (United States)

Published in SPIE Proceedings Vol. 3273:
Laser Techniques for Condensed-Phase and Biological Systems
Norbert F. Scherer; Janice M. Hicks, Editor(s)

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