Share Email Print

Proceedings Paper

Are cubic nitrides viable materials for optoelectronic devices?
Author(s): Jochen R. Muellhaeuser; R. Klann; H. Yang; Oliver Brandt; Klaus H. Ploog
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

Motivated by the potential advantages that device-quality zinc blende nitrides would offer over their wurtzite counterparts for optoelectronic applications, the optical properties of state-of-the-art cubic GaN grown by molecular beam epitaxy on GaAs(001) are investigated in detail. In view of the high densities of structural defects being caused by the large lattice mismatch to the substrate, special attention is paid to the influence of nonradiative recombination processes on the room temperature band-edge luminescence. A detailed analysis of the temperature and excitation density dependence of the band-edge recombination allows to determine transition and activation energies.In conjunction with model calculations, the internal quantum efficiency and the non-radiative lifetimes are estimated. The decay times as well as the observed phenomenon of defect saturation are verified by time-resolved photoluminescence studies. Upon pulsed optical pumping, optical gain exceeding 100 cm-1 at an excitation energy density of 20 (mu) Jcm-2 is obtained at room temperature.

Paper Details

Date Published: 7 April 1998
PDF: 10 pages
Proc. SPIE 3279, Light-Emitting Diodes: Research, Manufacturing, and Applications II, (7 April 1998); doi: 10.1117/12.304428
Show Author Affiliations
Jochen R. Muellhaeuser, Paul-Drude-Institut fuer Festkoerperelektronik (Germany)
R. Klann, Paul-Drude-Institut fuer Festkoerperelektronik (Germany)
H. Yang, Paul-Drude-Institut fuer Festkoerperelektronik (Germany)
Oliver Brandt, Paul-Drude-Institut fuer Festkoerperelektronik (Germany)
Klaus H. Ploog, Paul-Drude-Institut fuer Festkoerperelektronik (Germany)

Published in SPIE Proceedings Vol. 3279:
Light-Emitting Diodes: Research, Manufacturing, and Applications II
E. Fred Schubert, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?