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Proceedings Paper

Ultrahigh-density optical recording using a scanning near-field optical microscope
Author(s): Yuan Ying Lu; Din Ping Tsai; Wen Rei Guo; Sheng-Chang Chen; Jia Reuy Liu; Han-Ping D. Shieh
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Paper Abstract

Near-field scanning optical microscope (NSOM) system with a bent or a straight optical fiber probe has been successfully developed to perform optical recording on the surface of cyanine (C35H35CIN2-O4) dye layer or Ge21Te26Sb53 phase change (PC) thin film. Optical writing bits < 40 nm on the cyanine dye layer of a commercial compact disk-recordable were shown by atomic force microscope images of our tapping mode NSOM. For an vertical reflection mode NSOM, both optical writing and reading can be achieved on Ge21Te26Sb53 PC thin film, and the diameter of 500 nm recording bits are shown.

Paper Details

Date Published: 15 March 1998
PDF: 5 pages
Proc. SPIE 3276, Miniaturized Systems with Micro-Optics and Micromechanics III, (15 March 1998); doi: 10.1117/12.302401
Show Author Affiliations
Yuan Ying Lu, National Chung Cheng Univ. (Taiwan)
Din Ping Tsai, National Chung Cheng Univ. (Taiwan)
Wen Rei Guo, National Chung Cheng Univ. (Taiwan)
Sheng-Chang Chen, Industrial Technology Research Institute (Taiwan)
Jia Reuy Liu, National Chiao Tung Univ. (Taiwan)
Han-Ping D. Shieh, National Chiao Tung Univ. (Taiwan)

Published in SPIE Proceedings Vol. 3276:
Miniaturized Systems with Micro-Optics and Micromechanics III
M. Edward Motamedi; Rolf Goering, Editor(s)

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