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Proceedings Paper

Deposition and properties of polycrystalline cobalt ferrite films for magneto-optical recording
Author(s): K. P. Polyakova; V. A. Seredkin; V. V. Polyakov; A. A. Lepeshev; Vladimir F. Pavlov
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Paper Abstract

The polycrystalline cobalt ferrite films were deposited by dc-sputtering method from ferrite targets. These targets were conductive because of using of reduction atmosphere for time its preparation that allowed dc-sputtering. The magnetic and magneto-optical properties of these films have been investigated. The prepared Co0.07Fe2.3O4 polycrystalline films had perpendicular magnetic anisotropy, high coercivity (2 - 5 kOe) and good hysteresis loop squareness. It was established that perpendicular anisotropy constant and coercivity of films depends on substrate thermal expansion coefficient. The wavelength dependence of Faraday rotation (Theta) F is typical that for cobalt ferrite films and have two maximum: (Theta) F equals 2,7 deg/micrometers within (lambda) equals 0,5 - 0,53 micrometers and (Theta) F equals 2,5 deg/micrometers at (lambda) equals 0,8 micrometers , last presents the practical interest and is sufficiently high value. Magneto-optical figure of merit reaches 0,5 deg. at (lambda) equals 0,63 micrometers and 3,0 deg at (lambda) equals 0.8 micrometers . According to achieved results the polycrystalline cobalt ferrite Co0.7Fe2.3O4 films are a good candidate for a magneto-optical storage media.

Paper Details

Date Published: 1 January 1998
PDF: 7 pages
Proc. SPIE 3347, Optical Information Science and Technology (OIST97): Optical Recording Mechanisms and Media, (1 January 1998); doi: 10.1117/12.301402
Show Author Affiliations
K. P. Polyakova, Institute of Physics (Russia)
V. A. Seredkin, Institute of Physics (Russia)
V. V. Polyakov, Institute of Physics (Russia)
A. A. Lepeshev, Institute of Physics (Russia)
Vladimir F. Pavlov, Institute of Physics (Russia)

Published in SPIE Proceedings Vol. 3347:
Optical Information Science and Technology (OIST97): Optical Recording Mechanisms and Media
Andrei L. Mikaelian, Editor(s)

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