The influence of aberrations (spherical aberration and wavefront tilt) of the optical system of a Fourier transform infrared spectrometer (FTIR) spectrometer on the measurement precision is presented. The computer simulation of the Michelson interferometer operation has been performed. Two cases are considered. In the first case an aberrated wave was introduced in the movable arm only, while in the second one the aberrated waves were present in both arms. Successively the Fourier interferogram at the detector plane was obtained vs. displacement of the interferometer mirror, and the fast Fourier transform was applied to recover the original spectrum. The spectrum distorted by aberrations was compared with the results of the ideal spectrometer to determine errors introduced by imperfections of the optical system.

Date Published: 1 January 1998
PDF: 5 pages
Proc. SPIE 3320, Tenth Polish-Czech-Slovak Optical Conference: Wave and Quantum Aspects of Contemporary Optics, (1 January 1998); doi: 10.1117/12.301338

Published in SPIE Proceedings Vol. 3320:
Tenth Polish-Czech-Slovak Optical Conference: Wave and Quantum Aspects of Contemporary Optics
Jerzy Nowak; Marek Zajac, Editor(s)