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Proceedings Paper

Field electron emission from carbon-containing thin films
Author(s): Jian Chen; A. X. Wei; H. Y. Zhang; Y. Lu; Xiangyang Zheng; Dang Mo; S. Q. Peng; N. S. Xu
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Paper Abstract

Details are given of an experimental study of field electron emission phenomenon associated with two types of carbon containing thin film, i.e. non-doped fullerene C60 and amorphous diamond films. A transparent anode imaging technique was used to record the spatial distribution of individual emission sites and the total emission current-voltage (I-V) characteristic of the films. This study has revealed that stable electron emission can be obtained from both types of film at fields as low as 3 - 6 MV/m. A quasi-direct tunneling model is proposed to explain the observed emission.

Paper Details

Date Published: 20 February 1998
PDF: 5 pages
Proc. SPIE 3175, Third International Conference on Thin Film Physics and Applications, (20 February 1998); doi: 10.1117/12.300687
Show Author Affiliations
Jian Chen, Zhongshan Univ. (China)
A. X. Wei, Zhongshan Univ. (China)
H. Y. Zhang, Zhongshan Univ. (China)
Y. Lu, Zhongshan Univ. (China)
Xiangyang Zheng, Zhongshan Univ. (China)
Dang Mo, Zhongshan Univ. (China)
S. Q. Peng, Zhongshan Univ. (China)
N. S. Xu, Zhongshan Univ. (China)

Published in SPIE Proceedings Vol. 3175:
Third International Conference on Thin Film Physics and Applications
Shixun Zhou; Yongling Wang; Yi-Xin Chen; Shuzheng Mao, Editor(s)

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