
Proceedings Paper
Temperature dependence of porous silica antireflective (AR) coatingFormat | Member Price | Non-Member Price |
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Paper Abstract
In this paper, the antireflective coatings consisting of porous silica particles from a silica sol are applied by dip method. The relationships among composition, viscosity and temperature have been studied. The coating homogeneity is opium for the laser wavelengths of 1064 nm, 532 nm and 355 nm. The peak transmission of coated BK-7 glass substrate is higher than 99.5%. The laser induced damage thresholds of the antireflective coatings were range of 7 - 10 J/cm2, for 1 ns pulse width and 1064 nm wavelength. These damage thresholds were suitable for our national ICF program. It is noted that the optical homogeneity of coating and the viscosity of coating sol were strongly influenced by the temperatures in the duration of sol ripening.
Paper Details
Date Published: 20 February 1998
PDF: 5 pages
Proc. SPIE 3175, Third International Conference on Thin Film Physics and Applications, (20 February 1998); doi: 10.1117/12.300654
Published in SPIE Proceedings Vol. 3175:
Third International Conference on Thin Film Physics and Applications
Shixun Zhou; Yongling Wang; Yi-Xin Chen; Shuzheng Mao, Editor(s)
PDF: 5 pages
Proc. SPIE 3175, Third International Conference on Thin Film Physics and Applications, (20 February 1998); doi: 10.1117/12.300654
Show Author Affiliations
Yongxing Tang, Shanghai Institute of Optics and Fine Mechanics (China)
Yueqin Le, Shanghai Institute of Optics and Fine Mechanics (China)
Weiqing Zhang, Shanghai Institute of Optics and Fine Mechanics (China)
Yueqin Le, Shanghai Institute of Optics and Fine Mechanics (China)
Weiqing Zhang, Shanghai Institute of Optics and Fine Mechanics (China)
Minhua Jiang, Shanghai Institute of Optics and Fine Mechanics (China)
Jinren Sun, Shanghai Institute of Optics and Fine Mechanics (China)
Xiaolin Liu, Shanghai Institute of Optics and Fine Mechanics (China)
Jinren Sun, Shanghai Institute of Optics and Fine Mechanics (China)
Xiaolin Liu, Shanghai Institute of Optics and Fine Mechanics (China)
Published in SPIE Proceedings Vol. 3175:
Third International Conference on Thin Film Physics and Applications
Shixun Zhou; Yongling Wang; Yi-Xin Chen; Shuzheng Mao, Editor(s)
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