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Proceedings Paper

Continuous monitoring of large civil structures using a digital fiber optic motion sensor system
Author(s): Malcolm H. Hodge; Theodore C. Kausel Jr.
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Paper Abstract

There is no single attribute which can always predict structural deterioration. Accordingly, we have developed a scheme for monitoring a wide range of incipient deterioration parameters, all based on a single motion sensor concept. In this presentation, we describe how an intrinsically low power- consumption fiber optic harness can be permanently deployed to poll an array of optical sensors. The function and design of these simple, durable, and naturally digital sensors is described, along with the manner in which they have been configured to collect information for changes in the most important structural aspects. The SIMS system is designed to interrogate each sensor up to five-thousand times per second for the life of the structure, and to report sensor data back to a remote computer base for current and long-term analysis, and is directed primarily towards bridges. By suitably modifying the actuation of this very precise motion sensor, SIMS is able to track bridge deck deflection and vibration, expansion joint travel, concrete and rebar corrosion, pothole development, pier scour and tilt. Other sensors will track bolt clamp load, cable tension, and metal fatigue. All of these data are received within microseconds, which means that appropriate computer algorithm manipulations can be carried out to correlate one sensor with other sensors in real time. This internal verification feature automatically enhances confidence in the system's predictive ability and alerts the user to any anomalous behavior.

Paper Details

Date Published: 31 March 1998
PDF: 11 pages
Proc. SPIE 3400, Structural Materials Technology III: An NDT Conference, (31 March 1998); doi: 10.1117/12.300078
Show Author Affiliations
Malcolm H. Hodge, Structural Integrity Monitoring Systems, Inc. (United States)
Theodore C. Kausel Jr., Structural Integrity Monitoring Systems, Inc. (United States)

Published in SPIE Proceedings Vol. 3400:
Structural Materials Technology III: An NDT Conference
Ronald D. Medlock; David C. Laffrey, Editor(s)

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