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Proceedings Paper

Director field in a liquid crystal: direct measurement method
Author(s): Andrzej Walczak; Edward Nowinowski-Kruszelnicki; Aleksander Kiezun
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Paper Abstract

The refractive index profile (RIP) is measured to provide data for obtaining local optical axis arrangement in the waveguide cross-section. Measurements have been made in the electric field applied perpendicularly across the layer in a liquid crystalline waveguide. New approach is proposed to accomplish RIP measurement in a direct way. The m - line method is presented as a tool that allows one to do it and to improve the attenuated total reflection disadvantages as well. Obtained results maintain applicability of the m - line method for a direct RIP measurement. Nematic LC layer has been examined as well described in the literature to verify observations. Most interesting seems those results illustrating the presence and the deformation of the boundary layer in homogeneous LC layer alignment.

Paper Details

Date Published: 1 February 1998
PDF: 7 pages
Proc. SPIE 3318, Liquid Crystals: Physics, Technology, and Applications, (1 February 1998); doi: 10.1117/12.300000
Show Author Affiliations
Andrzej Walczak, Military Univ. of Technology (Poland)
Edward Nowinowski-Kruszelnicki, Military Univ. of Technology (Poland)
Aleksander Kiezun, Military Univ. of Technology (Poland)

Published in SPIE Proceedings Vol. 3318:
Liquid Crystals: Physics, Technology, and Applications
Jolanta Rutkowska; Stanislaw J. Klosowicz; Jerzy Zielinski; Jozef Zmija, Editor(s)

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