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Proceedings Paper

Supermirror fabrication via electroforming
Author(s): Melville P. Ulmer; Robert I. Altkorn; Allen S. Krieger; Daniel R. Parsignault; Yip-Wah Chung; M. S. Wong; Barry P. Lai; Derrick C. Mancini; Peter Z. Takacs; Eugene L. Church
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Paper Abstract

As part of a project to develop methods of placing highly reflective multilayer coatings on the inside of Wolter I mirrors, we have been pursuing a program of measuring flat mirrors. These flats have been produced and examined at various stages of the process we plan to use to fabricate multilayer coated Wolter I mirrors. The flats were measured via optical profiler, AFM, (both done at Brookhaven National Lab) and X-ray reflection (done at the Argonne National Lab Advanced Photon Source). We report for the first time, to our knowledge, the successful placement of multilayers on an electroform by depositing the multilayers on a master and then electroforming onto this master and removing the multilayers, intact, on the electroform. This process is the one we plan to use to place multilayers on the inside of Wolter I optics.

Paper Details

Date Published: 1 November 1997
PDF: 10 pages
Proc. SPIE 3152, Materials, Manufacturing, and Measurement for Synchrotron Radiation Mirrors, (1 November 1997); doi: 10.1117/12.295562
Show Author Affiliations
Melville P. Ulmer, Northwestern Univ. (United States)
Robert I. Altkorn, Northwestern Univ. (United States)
Allen S. Krieger, Radiation Science Inc. (United States)
Daniel R. Parsignault, Radiation Science Inc. (United States)
Yip-Wah Chung, Northwestern Univ. (United States)
M. S. Wong, Northwestern Univ. (United States)
Barry P. Lai, Argonne National Lab. (United States)
Derrick C. Mancini, Argonne National Lab. (United States)
Peter Z. Takacs, Brookhaven National Lab. (United States)
Eugene L. Church, Brookhaven National Lab. (United States)

Published in SPIE Proceedings Vol. 3152:
Materials, Manufacturing, and Measurement for Synchrotron Radiation Mirrors
Peter Z. Takacs; Thomas W. Tonnessen, Editor(s)

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