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Proceedings Paper

Photoluminescence and electroluminescence characteristics of CaSiN2:Eu phosphor
Author(s): Soon Seok Lee; Sungkyoo Lim; Sey-Shing Sun; John F. Wager
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Paper Abstract

Photoluminescenc eand electroluminescence of CaSiN2:Eu materials were investigted to develop a new phosphor for thin film electroluminescence (TFEL) device applications. Ca3N2 and Si3N4 powders were mixed to form CaSiN2 hostmaterials and Eu was added as the luminescent center. The mixed powermatrials were cold pressed under the pressure of 1 Kg/cm2 to make pellets, and fired at 1400 degrees Celsius for 2 hours under N2H2 envrionemtn. Th ex-ry diffraction(CRD) patterns of synthesizd materals wer well matched with CaSiN2 of joint committee for powder diffraction standards (JCPDS) csrad. When illuminated by ultravilet rays, th enew phosphors emitted very bright red ligh of peak wav lenegth centered at 620 nm. Th TFEL devices with CaSiN2:Eu phosphor layser swre grown by sputter depositonof CaSiN2:Eu target. Red light emission was observed when the peak amplitude of the applied voltge exceeded 116 V.l The luminance was shown to increase sharply withth increase of the applied voltage. The maximum luminance was 1.62 Cd/m2 at the applied peak voltage of 276 V. The red emission from CaSiN2:Eu TFEL device seems to result from electronic transition of Eu3+ ions.The emission spectra of TFEl devices matchwell withth ephotoluminescence spectra of CaSiN2:Ey powders. The new devices structure and fabrication processes for the iimprovement of emission intenityof CaSiN2:Eu TFEl devices ar under investigation.

Paper Details

Date Published: 14 November 1997
PDF: 9 pages
Proc. SPIE 3241, Smart Materials, Structures, and Integrated Systems, (14 November 1997); doi: 10.1117/12.293532
Show Author Affiliations
Soon Seok Lee, Dankook Univ. (South Korea)
Sungkyoo Lim, Dankook Univ. (South Korea)
Sey-Shing Sun, Planar Systems, Inc. (United States)
John F. Wager, Oregon State Univ. (United States)

Published in SPIE Proceedings Vol. 3241:
Smart Materials, Structures, and Integrated Systems
Alex Hariz; Vijay K. Varadan; Olaf Reinhold, Editor(s)

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