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Proceedings Paper

Modeling the optical response of grating-profiled PtSi/Si infrared detectors
Author(s): Chris J. T. Rea; Gerald F. Cairns; Paul Dawson
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Paper Abstract

Modeling the optical response of grating profiled PtSi/Si structures is examined to demonstrate the potential of microstructuring in optimizing the absorption of infrared detectors. Coupling to angularly broad surface plasmon polariton resonances near normal incidence is, in fact, achieved at both Si/PtSi and SiO2/PtSi interfaces for the same grating parameters in the wavelength ranges 3.0 - 4.4 micrometer and 1.3 - 1.9 micrometer respectively. These ranges correspond to two infrared, atmospheric transmission windows, and demonstrate the potential for a single device geometry to operate optimally in two different spectral bands. It is also shown that, throughout these spectral bands, it is possible to attain reflectance significantly lower than that of the planar structure counterparts in the angle range 0 degrees to plus or minus 20 degrees (corresponding to the use of F1.4 optics), along with containment of low reflectance to that angle range. Absorption mediated by the PtSi/Si surface plasmon polariton mode may be of particular interest in these Schottky barrier structures, since there would be considerable enhancement in the generation of hot carriers in the near barrier region where they have a better chance of direct or indirect (via elastic scattering) promotion over the barrier to give rise to a detectable charge.

Paper Details

Date Published: 23 October 1997
PDF: 9 pages
Proc. SPIE 3122, Infrared Spaceborne Remote Sensing V, (23 October 1997); doi: 10.1117/12.292711
Show Author Affiliations
Chris J. T. Rea, Queen's Univ. of Belfast (United Kingdom)
Gerald F. Cairns, Queen's Univ. of Belfast (United Kingdom)
Paul Dawson, Queen's Univ. of Belfast (United Kingdom)

Published in SPIE Proceedings Vol. 3122:
Infrared Spaceborne Remote Sensing V
Marija Strojnik; Bjorn F. Andresen, Editor(s)

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