Share Email Print

Proceedings Paper

Arbitrary order aberrations for elements characterized by measured fields
Author(s): Kyoko Makino; Martin Berz
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

The precise understanding of the properties of large acceptance devices like modern nuclear spectrographs often requires the calculation of high-order aberrations. In many practical cases, it is necessary to treat all details of the fields of the elements, and instead of utilizing more or less simple field models, one has to rely on measured data. It is shown how aberrations of in principle unlimited orders can be obtained from measured field data; moreover, for the remaining aberrations of yet higher order, rigorous upper bounds of their influence on the motion can be found. The methods are used for the analysis and correction of the high-resolution S800 spectrograph at MSU.

Paper Details

Date Published: 25 September 1997
PDF: 7 pages
Proc. SPIE 3155, Charged Particle Optics III, (25 September 1997); doi: 10.1117/12.287813
Show Author Affiliations
Kyoko Makino, Michigan State Univ. (United States)
Martin Berz, Michigan State Univ. (United States)

Published in SPIE Proceedings Vol. 3155:
Charged Particle Optics III
Eric Munro, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?