
Proceedings Paper
Reference beam apodization in angularly multiplexed volume holographyFormat | Member Price | Non-Member Price |
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Paper Abstract
Bragg selectivity in volume holography can be exploited to store many holographic pages within the same physical volume. The detailed character of this Bragg selectivity is also responsible for the crosstalk among stored pages and is governed by the 3D envelope function of the volume hologram. Other workers have discussed these crosstalk effects in detail. In this paper we discuss the effect of reference beam apodization on the angular selectivity of photorefractive volume holograms. Apodization using phase-only beam forming is studied and we focus on the use of apodization during hologram retrieval. The trade-offs among storage capacity, information density, and noise are discussed for both the apodized and unapodized configurations. The presence of conventional hologram crosstalk as well as effects due to material absorption and recording angle jitter are included.
Paper Details
Date Published: 22 September 1997
PDF: 6 pages
Proc. SPIE 3137, Photorefractive Fiber and Crystal Devices: Materials, Optical Properties, and Applications III, (22 September 1997); doi: 10.1117/12.287774
Published in SPIE Proceedings Vol. 3137:
Photorefractive Fiber and Crystal Devices: Materials, Optical Properties, and Applications III
Francis T. S. Yu; Shizhuo Yin, Editor(s)
PDF: 6 pages
Proc. SPIE 3137, Photorefractive Fiber and Crystal Devices: Materials, Optical Properties, and Applications III, (22 September 1997); doi: 10.1117/12.287774
Show Author Affiliations
Mark Allen Neifeld, Optical Sciences Ctr./Univ. of Arizona (United States)
Mark E. McDonald, Optical Sciences Ctr./Univ. of Arizona (United States)
Mark E. McDonald, Optical Sciences Ctr./Univ. of Arizona (United States)
Brian M. King, Optical Sciences Ctr./Univ. of Arizona (United States)
Published in SPIE Proceedings Vol. 3137:
Photorefractive Fiber and Crystal Devices: Materials, Optical Properties, and Applications III
Francis T. S. Yu; Shizhuo Yin, Editor(s)
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