Share Email Print

Proceedings Paper

Advanced techniques in lamp characterization
Author(s): Ian Lewin; John O'Farrell; James E. Walker III
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

Perhaps the most significant factor impacting the accuracy of software for the design of illumination optics is the proper characterization of the light source. Techniques used in the past have employed a simplified geometry to model the emitting element of the lamp along with an intensity distribution which has been measured at some fixed distance. This produced major inaccuracies in the prediction of the optical performance of complicated systems. The authors have been active for several years in developing improved techniques for lamp characterization. It is the intent of this paper to describe the aspects of lamp modeling which we have found to be important. These factors include the use of 'far-field' and 'near-field' photometry, the spatial variation of luminance over the lamp, and re-emission of radiation incident on the lamp. The most difficult light sources to model accurately are high intensity discharge sources. Methods are discussed for the solid modeling of such light sources by the use of luminance and intensity data. Instrumentation for the collection of these data is desired.

Paper Details

Date Published: 26 September 1997
PDF: 10 pages
Proc. SPIE 3140, Photometric Engineering of Sources and Systems, (26 September 1997); doi: 10.1117/12.284091
Show Author Affiliations
Ian Lewin, Lighting Sciences Inc. (United States)
John O'Farrell, Lighting Sciences Inc. (United States)
James E. Walker III, Lighting Sciences Inc. (United States)

Published in SPIE Proceedings Vol. 3140:
Photometric Engineering of Sources and Systems
Angelo V. Arecchi, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?