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Proceedings Paper

Automated inspection and dimension measurement of optoelectronic components
Author(s): Tuan-Kay Lim; Sundaram Swaminathan; C. K. Woo; C. N. Chan; J. Y. K. Wong
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Paper Abstract

We report on the development of an automated inspection and dimension measurement system for optoelectronic components. Images of the components are captured with a CCD camera. Precision templates are designed for image calibration, and a sub-pixel detection software is developed for dimension measurement. Experimental results demonstrate that the system is capable of measuring the dimensions with an accuracy of 30 micrometers .

Paper Details

Date Published: 18 August 1997
PDF: 10 pages
Proc. SPIE 3185, Automatic Inspection and Novel Instrumentation, (18 August 1997); doi: 10.1117/12.284044
Show Author Affiliations
Tuan-Kay Lim, Nanyang Technological Univ. (Singapore)
Sundaram Swaminathan, Nanyang Technological Univ. (Singapore)
C. K. Woo, EG&G Heimann Optoelectronics Pte. Ltd. (Singapore)
C. N. Chan, Nanyang Technological Univ. (Singapore)
J. Y. K. Wong, Nanyang Technological Univ. (Singapore)

Published in SPIE Proceedings Vol. 3185:
Automatic Inspection and Novel Instrumentation
Anthony Tung Shuen Ho; Sreenivas Rao; Lee Ming Cheng, Editor(s)

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