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Proceedings Paper

Infrared microcalorimetric spectroscopy using uncooled thermal detectors
Author(s): Panos G. Datskos; Slobodan Rajic; Irene Datskou; Charles M. Egert
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Paper Abstract

We have investigated a novel IR microcalorimetric spectroscopy technique that can be used to detect the presence of trace amounts of target molecules. The chemical detection is accomplished by obtaining the IR photothermal spectra of molecules absorbed on the surface of an uncooled thermal detector. Traditional gravimetric based chemical detectors require highly selective coatings to achieve chemical specificity. In contrast, IR microcalorimetric based detection requires only moderately specific coatings since the specificity is a consequence of the photothermal spectrum. We have obtained IR photothermal spectra for trace concentrations of chemical analytes including diisopropyl methylphosphonate (DIMP), 2-mercaptoethanol and trinitrotoluene (TNT) over the wavelength region 2.5 to 14.5 micrometers . We found that in the wavelength region 2.5 to 14.5 micrometers DIMP exhibits two strong photothermal peaks. The photothermal spectra of 2-mercaptoethanol and TNT exhibit a number of peaks in the wavelength region 2.5 to 14.5 micrometers and the photothermal peaks for 2-mercaptoethanol are in excellent agreement with IR absorption peaks present in its IR spectrum. The photothermal response of chemical detectors based on microcalorimetric spectroscopy has been found to vary reproducibly and sensitively as a consequence of adsorption of small number of molecules on a detector surface followed by photon irradiation and can be used for improved chemical characterization.

Paper Details

Date Published: 31 October 1997
PDF: 8 pages
Proc. SPIE 3118, Imaging Spectrometry III, (31 October 1997); doi: 10.1117/12.283834
Show Author Affiliations
Panos G. Datskos, Univ. of Tennessee and Oak Ridge National Lab. (United States)
Slobodan Rajic, Oak Ridge National Lab. (United States)
Irene Datskou, Oak Ridge National Lab. (United States)
Charles M. Egert, Oak Ridge National Lab. (United States)

Published in SPIE Proceedings Vol. 3118:
Imaging Spectrometry III
Michael R. Descour; Sylvia S. Shen, Editor(s)

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