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Proceedings Paper

Calibration of the UV/ion shields for the AXAF High-Resolution Camera
Author(s): G. R. Meehan; Stephen S. Murray; Martin V. Zombeck; Ralph Porter Kraft; K. Kobayashi; John H. Chappell; Almus T. Kenter; Marco Barbera; Alfonso Collura; Salvatore Serio
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Paper Abstract

The high resolution camera (HRC) is one of AXAF's two focal plane instruments. It consists of two detectors: the HRC-I which is optimized for direct imaging of x-ray sources; and the HRC-S which is optimized as the spectroscopic read-out of the low energy transmission grating (LETG). Both detectors are comprised of a chevron pair of micro-channel plates (MCPs) with a crossed grid charge detector (CGCD) and a UV/ion shield (UVIS). The role of the UVIS is to minimize the detectors' sensitivity to low energy electrons, ions and UV light, while providing sufficient x-ray transmission in the 0.1 to 10 keV x-ray band. In this paper, we report on the results of the flight UVIS calibration measurements. Specifically, x-ray and UV transmission measurements obtained at the HRC X-ray Test Facility of the Smithsonian Astropysical Observatory, and x- ray transmission measurements of UVIS witness samples obtained at a synchrotron light source facility.

Paper Details

Date Published: 15 October 1997
PDF: 27 pages
Proc. SPIE 3114, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy VIII, (15 October 1997); doi: 10.1117/12.283790
Show Author Affiliations
G. R. Meehan, Smithsonian Astrophysical Observatory (United States)
Stephen S. Murray, Smithsonian Astrophysical Observatory (United States)
Martin V. Zombeck, Smithsonian Astrophysical Observatory (United States)
Ralph Porter Kraft, Smithsonian Astrophysical Observatory (United States)
K. Kobayashi, Smithsonian Astrophysical Observatory (United States)
John H. Chappell, Smithsonian Astrophysical Observatory (United States)
Almus T. Kenter, Smithsonian Astrophysical Observatory (United States)
Marco Barbera, Istituto e Osservatorio Astronomico G.S. Vaiana (Italy)
Alfonso Collura, Istituto e Osservatorio Astronomico G.S. Vaiana (Italy)
Salvatore Serio, Istituto e Osservatorio Astronomico G.S. Vaiana (Italy)

Published in SPIE Proceedings Vol. 3114:
EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy VIII
Oswald H. W. Siegmund; Mark A. Gummin, Editor(s)

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