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Proceedings Paper

Ultrafast and nonlinear optical characterization of optical limiting processes in fullerenes
Author(s): Randolph S. Kohlman; Victor I. Klimov; M. Grigorova; X. Shi; Benjamin R. Mattes; Duncan W. McBranch; H. Wang; Fred Wudl; Jean-Luc R. Nogues; William V. Moreshead
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Paper Abstract

We present recent results of broadband femtosecond (fs) transient absorption (TA) and broadband nanosecond (ns) optical limiting (OL) studies of C60 and derivatized C60. Improvements in measurement techniques for fs TA spectra provide sensitivity to 10-5 in differential transmission, allowing detailed comparison of excited-state spectra with established energy level diagrams, as well as comparison of the ratio of triplet to singlet excited-state absorption cross sections from TA spectra with those obtained by modeling time transients at different wavelengths. For derivatized fullerenes, which provide enhanced solubility and a ground-state absorption extended into the IR compared with C60 there is no spectral region where the triplet absorption cross section dominates the singlet as strongly as in C60. Wavelength-dependent studies show that the OL response improves monotonically at longer wavelengths, demonstrating broadband limiting in all 6,6 mono-adducts and neat C60. We report new approaches to processing sol-gel encapsulated fullerenes to improve the OL performance of solid-state materials to approach the response of solution limiters.

Paper Details

Date Published: 1 November 1997
PDF: 11 pages
Proc. SPIE 3142, Fullerenes and Photonics IV, (1 November 1997); doi: 10.1117/12.283754
Show Author Affiliations
Randolph S. Kohlman, Los Alamos National Lab. (United States)
Victor I. Klimov, Los Alamos National Lab. (United States)
M. Grigorova, Los Alamos National Lab. (United States)
X. Shi, Los Alamos National Lab. (United States)
Benjamin R. Mattes, Los Alamos National Lab. (United States)
Duncan W. McBranch, Los Alamos National Lab. (United States)
H. Wang, Univ. of California/Santa Barbara (United States)
Fred Wudl, Univ. of California/Santa Barbara (United States)
Jean-Luc R. Nogues, GELTECH, Inc. (United States)
William V. Moreshead, GELTECH, Inc. (United States)

Published in SPIE Proceedings Vol. 3142:
Fullerenes and Photonics IV
Zakya H. Kafafi, Editor(s)

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