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Proceedings Paper

Photoacoustic spectroscopy of photovoltaic materials
Author(s): M. A. Slifkin; L. Lurie; Aryeh M. Weiss
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Paper Abstract

A photoacoustic spectrometer is described which has been constructed to measure the spectra of photovoltaic materials in the ultra violet, visible and near infra red regions. The range of this photoacoustic spectrometer is from 0.3 to 1.8 micrometers. This technique has the advantage of being non- intrusive and non-destructive. Measurements have been made of a variety of photovoltaic materials, including a CdS/CuIn1- xGaxSe2 heterojunction and an InP/InGaAsP quantum well layer system. Bands arising from intrinsic impurity subgap levels were observed beyond the band edges.

Paper Details

Date Published: 22 September 1997
PDF: 7 pages
Proc. SPIE 3110, 10th Meeting on Optical Engineering in Israel, (22 September 1997); doi: 10.1117/12.281326
Show Author Affiliations
M. A. Slifkin, Jerusalem College of Technology (Israel)
L. Lurie, Jerusalem College of Technology (Israel)
Aryeh M. Weiss, Jerusalem College of Technology (Israel)

Published in SPIE Proceedings Vol. 3110:
10th Meeting on Optical Engineering in Israel
Itzhak Shladov; Stanley R. Rotman, Editor(s)

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