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Proceedings Paper

Characterization measurements of the wideband infrared scene projector resistor array: II
Author(s): Lawrence E. Jones; Robert G. Stockbridge; Allen R. Andrews; W. Larry Herald; Andrew W. Guertin
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Paper Abstract

Kinetic Energy Weapon (KEW) program under the Ballistic Missile Defense Office (BMDO) need high fidelity, fast framing infrared (IR) imaging seekers. As imaging sensors have matured to support BMDO, the complexity of functions assigned to the KEW weapon systems has amplified the necessity for robust hardware-in-the-loop (HWIL) simulation facilities to reduce program risk. Tactical weapon systems are also turning to imaging focal plane array seekers. They too require more sophisticated HWIL testing. The IR projector, an integral component of a HWIL simulation, must reproduce the real world with enough fidelity that the unit- under-test's software will respond to the projected scenario of images as through it were viewing the real world. The MOSFET resistor array IR scene projector shows great promise in cryogenic vacuum chamber as well as room temperature testing. Under the Wideband Infrared Scene Projector (WISP) program, a second generation resistor array has been delivered and characterized. Characterization measurements to include: spectral output, dynamic range capability, apparent temperature, rise time, and fall time, have been accomplished on the second generation array at the Kinetic Kill Vehicle Hardware-in-the Loop Simulator facility and the Guided Weapons Evaluation Facility, Eglin AFB, FL. Dynamic range output exceeds to WISP specification. Other parameters such as, rise time etc., either meet or are close to meeting system specifications. The final design of the WISP arrays is currently in progress based on these results. Also reported on in this document are performance measurements of the analog drive electronics' noise level, accuracy and resolution. The performance of the drive electronics had to be established before any radiometric output could be measured.

Paper Details

Date Published: 15 July 1997
PDF: 17 pages
Proc. SPIE 3084, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing II, (15 July 1997); doi: 10.1117/12.280970
Show Author Affiliations
Lawrence E. Jones, Science Applications International Corp. (United States)
Robert G. Stockbridge, Air Force Wright Lab. (United States)
Allen R. Andrews, Computer Sciences and Applications, Inc. (United States)
W. Larry Herald, Computer Science Applications, Inc. (United States)
Andrew W. Guertin, Vitro Technical Services, Inc. (United States)

Published in SPIE Proceedings Vol. 3084:
Technologies for Synthetic Environments: Hardware-in-the-Loop Testing II
Robert Lee Murrer Jr., Editor(s)

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